TAL labs offer a range of methods for thermal conductivity characterization. Including:
- Modified Transient Plane Source (MTPS) ASTM D7984
- NEW Transient Line Source (Needle Probe) ASTM D5930, ASTM D5334, IEEE 442-1981
- Guarded Hot Plate / Guarded Heat Flow ASTM C518, ASTM C177
- Laser Flash Diffusivity ASTM E1461, ASTM E2585
- Transient Plane Source (TPS) ISO 22007-2
Learn more about the differences amongst the variety of methods for thermal conductivity measurement.
TAL has tested a wide range of materials including:
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